🔬 Join us at the 18th Meeting of the French #Microscopy Society in the captivating city of #Rouen, where a blend of rich history and vibrant culture awaits! 🏰✨

The latest issue of "Microscopy and Analysis" (July/August 2023, Issue 67) unveils an article on the LiteScope AFM-in-SEM! 🌟 Discover how fusion of AFM and SEM redefines microscopy. CEO Jan Neuman highlights benefits and applications. Don't miss out! 🔍 analyticalscience.wiley.com/…

📣 Don't miss our #webinar recording! Join us as we delve into the world of #AFM -in-#SEM for #powders, #particles, and 2D materials #characterisation. 🔍 Gain insights into measuring surface #roughness and exploring advanced material properties. 🖥️ youtu.be/JfkZq0KlEIE

🔍 Curious about measuring surface roughness? Join our webinar to explore its impact, with real examples - pharmaceuticals & ceramics! 🌟 Unlock advanced properties of 2D mats through a multimodal study. Register! 🎯 forms.office.com/e/pYw58GUDH… #webinar #SEM #pharmacy #ceramics

AFM with the ability to measure individual #nanowires - that's LiteScope! 💪🏼 Read another article with LiteScope measurements, this time from the field of #pharmaceutic research. 💊Congratullations to Linnea Gustafsson and her research group from @KTHuniversity 👏🏼

Time has come! We are introducing the new AFM-in-SEM – LiteScope 2.5!  🎉🍾 For more information on this game-changing release, please visit our page at lnkd.in/grKJnE2b 🌐

One week left, and we can't wait to show you what we've been working on during the last few years! 💪🏽 Be ready next Wednesday, 29th of March.📆The #release is coming! More info here: nenovision.com/release-2023

We have a new comparison: precise as LiteScope's probe tip. 📐 The camera is spinning around a mesoporous hollow-core silica #particle covered with golden layer, at the moment scanned by LiteScope. 📸 Courtesy of David Zuza from @VSCHT.

Exciting news from NenoVision. Get ready to experience the future of In-Situ Correlative Microscopy! 🔮Stay tuned for the big reveal on March 29th 📑 Register now to be the first to know more: lnkd.in/e469-kdm #NenoVision #Microscopy #InSitu #Innovation #Science

We are happy to see talented students exploring the world! One of them is Marek Patočka, who helps us in @NenoVision with application tasks. 🔬 He is currently on his academic stay at the @WeizmannScience as part of his Master’s degree at the @VUTvBrne. All the best to Israel! 🙌🏻

Happy International Women's Day! 🎊 ... We wish a lot of professional & personal achievements to our female colleagues, partners, and all the women around the world. 👩🏻‍🔧👩🏾‍⚕️👩🏼‍💼 ... Here goes a photo of the fantastic team-mates from our company!

We are incredibly honoured and thrilled by the recommendation of Nobel Laureate Professor Henderson in recent amazing interview in Hyde Park Civilization. 📺See: ceskatelevize.cz/porady/1044… ... #brnoregion #electronmicroscopy #science

We are opening the #conference season in big. 🏗 Come to Darmstadt to visit us at the MC 2023! 👩🏽‍🏫Booth E1-34 🖼 Today's (Wednesday 1st of March) #poster presentation by Veronika Hegrová, 14:00-16:00 See you in Darmstadt!

The In-situ Microscopy Alliance was founded!👨‍👩‍👦‍👦 What's its purpose & mission? 🎯To connect industry and academia to advance the #insitu microscopy characterization tools, solutions, and services. See more: nenovision.com/about-us/coll…

"Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data" is a newly published #article showing off to the scientific world our new AI-driven tool for microscopic image data #correlation. 🖼See more: lnkd.in/eiw7vpGA

Defect analysis in #materialscience by LiteScope AFM-in-SEM.💡 The presented sample is a W-10Cr-1Hf composite, a prospective material for constructing #fusion reactors. ⚡ See more here: nenovision.com/applications/…. Courtesy of M. Vilémová, Institute of Plasma Physics, @CzechAcademy.

Meet us in two weeks at the Microscopy Conference 2023, held in Darmstadt, Germany, 26/02-02/03! 🏙 Visit our booth E1-34, just next to the main conference hall. 👩🏽‍🏫 See more at: nenovision.com/meet-nenovisi…

#failureanalysis by AFM-in-SEM? Infallible! 💪🏽As a result of this #insitu analysis of a Bipolar Junction Transistor after FIB etching, we managed to identify conductive layers, as the C-AFM measurement is independent of SEM material contrast. Courtesy of David Pléha from @onsemi.

Happy International Day of Women and Girls in Science - 11th of February!👩🏾‍🔬 We wish all the women and girls to find the motivation and will to dedicate their #career to such an exciting field, to be #successful with their projects and get the desired credit, results and reward.🏆